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Filters: Keyword is Leakage current and Author is Banerjee, Indrani  [Clear All Filters]
2010
P. Laha, Panda, A. B., Dahiwale, S., Date, K. S., Patil, K. R., Barhai, P. K., Das, A. K., Banerjee, I., and Mahapatra, S. K., “Effect of leakage current and dielectric constant on single and double layer oxides in MOS structure”, Thin Solid Films, vol. 519, no. 5, pp. 1530-1535, 2010.