biblio

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2010
P. Laha, Panda, A. B., Dahiwale, S., Date, K. S., Patil, K. R., Barhai, P. K., Das, A. K., Banerjee, I., and Mahapatra, S. K., “Effect of leakage current and dielectric constant on single and double layer oxides in MOS structure”, Thin Solid Films, vol. 519, no. 5, pp. 1530-1535, 2010.
2015
B. Busupalli, Date, K. S., Datar, S., and Prasad, B. L. V., “Preparation of Ni3S2 and Ni3S2-Ni nanosheets via solution based processes”, Crystal Growth & Design, vol. 15, no. 6, pp. 2584–2588, 2015.
2016
S. K. Kolekar, Dubey, A., Date, K. S., Datar, S., and Gopinath, C. S., “Attempt to correlate surface physics and chemical properties : molecular beam and Kelvin probe investigations of Ce 1-x Zr x O 2 thin films”, Physical Chemistry Chemical Physics, vol. 18, no. 39, pp. 27594-27602, 2016.