New approach towards imaging lambda-DNA using scanning tunneling microscopy/spectroscopy (STM/STS)

TitleNew approach towards imaging lambda-DNA using scanning tunneling microscopy/spectroscopy (STM/STS)
Publication TypeJournal Article
Year of Publication2008
AuthorsDey, S, Pethkar, S, Adyanthaya, SD, Sastry, M, Dharmadhikari, CV
JournalBulletin of Materials Science
Volume31
Issue3
Pagination309-312
Date PublishedJUN
ISSN0250-4707
KeywordsDNA, Langmuir Blodget technique, Scanning tunneling microscopy, silanization
Abstract

A new methodology to anchor A-DNA to silanized n-Si(111) surface using Langmuir Blodget trough was developed. The n-Si (111) was silanized by treating it with low molecular weight octyltrichlorosilane in toluene. Scanning tunneling microscopy (STM) image of lambda-DNA on octyltrichlorosilane deposited Si substrate shows areas exhibiting arrayed structures of 700 nm length and 40 nm spacing. Scanning tunneling spectroscopy (STS) at different stages depict a broad distribution of defect states in the bandgap region of n-Si(111) which presumably facilitates tunneling through otherwise insulating DNA layer.

DOI10.1007/s12034-008-0049-6
Type of Journal (Indian or Foreign)Foreign
Impact Factor (IF)0.944
Divison category: 
Physical and Materials Chemistry