TY - JOUR T1 - New approach towards imaging lambda-DNA using scanning tunneling microscopy/spectroscopy (STM/STS) JF - Bulletin of Materials Science Y1 - 2008 A1 - Dey, Shirshendu A1 - Pethkar, Sushama A1 - Adyanthaya, Suguna D. A1 - Sastry, Murali A1 - Dharmadhikari, C. V. KW - DNA KW - Langmuir Blodget technique KW - Scanning tunneling microscopy KW - silanization AB -

A new methodology to anchor A-DNA to silanized n-Si(111) surface using Langmuir Blodget trough was developed. The n-Si (111) was silanized by treating it with low molecular weight octyltrichlorosilane in toluene. Scanning tunneling microscopy (STM) image of lambda-DNA on octyltrichlorosilane deposited Si substrate shows areas exhibiting arrayed structures of 700 nm length and 40 nm spacing. Scanning tunneling spectroscopy (STS) at different stages depict a broad distribution of defect states in the bandgap region of n-Si(111) which presumably facilitates tunneling through otherwise insulating DNA layer.

PB - SPRINGER CY - 233 SPRING ST, NEW YORK, NY 10013 USA VL - 31 IS - 3 N1 - National Review and Coordination Meeting on Nanoscience and Nanotechnology, Hyderabad, INDIA, 2007 U3 - Foreign U4 - 0.944 ER -