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Journal Article
U. K. Bansal, Zwart, R. S., Bhavani, S., Wanyera, R., Gupta, V., and Bariana, H. S., “Microsatellite mapping identifies TTKST-effective stem rust resistance gene in wheat cultivars VL404 and Janz”, Molecular Breeding, vol. 30, no. 4, pp. 1757-1765, 2012.