Structural and surface morphological properties of chemically deposited Mo0.5W0.5S2 thin film

TitleStructural and surface morphological properties of chemically deposited Mo0.5W0.5S2 thin film
Publication TypeJournal Article
Year of Publication2012
AuthorsPatil, AA, Hankare, PP, Gaikwad, AB, Garadkar, KM
JournalJournal of Materials Science-Materials in Electronics
Volume23
Issue4
Pagination909-912
Date PublishedAPR
ISSN0957-4522
Abstract

Preparation of layered type semiconductor Mo0.5W0.5S2- thin films has been successfully done by using chemical bath deposition method. Objective of the studies are related to structural, optical, morphological and electrical properties of the thin films. The preparation method is based on the reaction between tartarate complex of Mo and W with thiourea in an aqueous alkaline medium at 363 K. X-Ray diffraction reveals a polycrystalline film composed of both MoS2 and WS2 phases. The optical study shows that the band gap of the film is 1.6 eV. Electrical conductivity is high which is in the order of 10(-3)-10(-2) (Omega cm)(-1).

DOI10.1007/s10854-011-0519-2
Type of Journal (Indian or Foreign)Foreign
Impact Factor (IF)1.486
Divison category: 
Physical and Materials Chemistry