<style face="normal" font="default" size="100%">Effect of leakage current and dielectric constant on single and double layer oxides in MOS structure</style>

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<style face="normal" font="default" size="100%">Effect of leakage current and dielectric constant on single and double layer oxides in MOS structure</style>

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17

<style face="normal" font="default" size="100%">Preparation of Ni3S2 and Ni3S2-Ni nanosheets via solution based processes</style>

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<style face="normal" font="default" size="100%">Attempt to correlate surface physics and chemical properties : molecular beam and Kelvin probe investigations of Ce 1-x Zr x O 2 thin films</style>