P.  Laha, Panda, A. B., Dahiwale, S., Date, K. S., Patil, K. R., Barhai, P. K., Das, A. K., Banerjee, I., and Mahapatra, S. K., ?Effect of leakage current and dielectric constant on single and double layer oxides in MOS structure?, Thin Solid Films, vol. 519, no. 5, pp. 1530-1535, 2010.

B.  Busupalli, Date, K. S., Datar, S., and Prasad, B. L. V., ?Preparation of Ni3S2 and Ni3S2-Ni nanosheets via solution based processes?, Crystal Growth & Design, vol. 15, no. 6, pp. 2584?2588, 2015.

S. K.  Kolekar, Dubey, A., Date, K. S., Datar, S., and Gopinath, C. S., ?Attempt to correlate surface physics and chemical properties : molecular beam and Kelvin probe investigations of Ce 1-x Zr x O 2 thin films?, Physical Chemistry Chemical Physics, vol. 18, no. 39, pp. 27594-27602, 2016.