01688nas a2200253   4500008004100000022001400041245009500055210006900150260010200219300001200321490000800333520076300341653002101104653001501125653001401140653001901154653002401173100002801197700001801225700001901243700002001262700002601282856012601308       2008                        eng d  a0253-413400aNear-complete phase transfer of single-wall carbon nanotubes by covalent functionalization0 aNearcomplete phase transfer of singlewall carbon nanotubes by co  aC V RAMAN AVENUE, SADASHIVANAGAR, P B \#8005, BANGALORE 560 080, INDIAbINDIAN ACAD SCIENCEScNOV  a599-6060 v1203 a<p>We describe here an efficient phase transfer of single wall carbon nanotubes (SWNTs) from aqueous to non-aqueous media using a unique amide functionalization route, where water soluble SWNTs (2.6 mg/mL) are effectively transferred to solvents like chloroform, toluene and CS(2). A maximum of 30 wt% of oxygenated groups have been generated on the side walls by rapid microwave treatment, leading to a solubility of more than 2.6 mg/mL in water. Approximate surface amine coverage of 50% has been accomplished after oxalyl chloride treatment as inferred from thermogravimetry and X-ray photoelectron spectroscopy by controlling several key parameters associated with the extent of functionalization including purity of the sample, temperature and time.</p>10aCarbon nanotubes10amicroscopy10aMicrowave10aNanostructures10asolubility of SWNTs1 aKakade, Bhalchandra, A.1 aPatil, Sanjay1 aSathe, Bhaskar1 aGokhale, Suresh1 aPillai, Vijayamohanan  uhttps://library.ncl.res.in/content/near-complete-phase-transfer-single-wall-carbon-nanotubes-covalent-functionalization-002142nas a2200265   4500008004100000022001400041245008100055210006900136260010800205300001000313490000700323520121400330653001501544653001101559653002401570653001101594100001901605700002001624700002501644700002301669700002101692700002101713700002701734856011501761       2008                        eng d  a1356-536200aXPS and AFM investigations on silver-based photoimageable thick film systems0 aXPS and AFM investigations on silverbased photoimageable thick f  aHOWARD HOUSE, WAGON LANE, BINGLEY BD16 1WA, W YORKSHIRE, ENGLANDbEMERALD GROUP PUBLISHING LIMITEDcJAN  a46-570 v253 a<p>Purpose - The purpose of this paper is to ascertain chemical changes occurring at various stages involved in processing of silver-based photoimageable thick films; and to determine ensuing topographical features which other wise appeared to be hindered in 2D scanning electron microscopy. Design/methodology/approach - Surface sensitive techniques, viz. X-ray photoelectron spectroscopy (XPS) and atomic force microscopy (AFM) were used. Findings - Interfacial adhesion of silver film with substrate (Al(2)O(3)) was specifically looked into with respect to role played by photoimaging (before and after exposure to ultra-violet light). XPS results revealed occurrence of subtle chemical changes in terms of unsaturation to saturation in C-C bonding and also an interesting C-Al bonding which presumably improves mechanical adhesion of unfired film with the alumina substrate. AFM was carried out to examine the surface roughness, particle size, and microstructure of film which are very important from the standpoint of high-frequency applications. Originality/value - Surface sensitive techniques like XPS and AFM were exclusively used in order to characterize silver-based photoimageable thick films.</p>10amicroscopy10aSilver10athick film circuits10aX-rays1 aUmarji, Govind1 aKetkar, Supriya1 aHawaldar, Ranjit, R.1 aGosavi, Suresh, W.1 aPatil, Kashinath1 aMulik, Uttam, P.1 aAmalnerkar, Dinesh, P.  uhttps://library.ncl.res.in/content/xps-and-afm-investigations-silver-based-photoimageable-thick-film-systems-0