01486nas a2200205   4500008004100000022001400041245007200055210006900127260008900196300001200285490000700297520075600304100001801060700001901078700001901097700001801116700002501134700001501159856010601174       2005                        eng d  a0376-471000aDestructive adsorption of methyl parathion over nanocrystalline MgO0 aDestructive adsorption of methyl parathion over nanocrystalline   aDR K S KRISHNAN MARG, NEW DELHI 110 012, INDIAbNATL INST SCIENCE COMMUNICATIONcFEB  a251-2550 v443 a<p>Destructive adsorption of methyl parathion (MP) has been investigated over few transition metal oxides and alkali earth metal oxides. Performance of alkaline earth oxides have been found to be better than transition metal oxides and best performance has been shown by aerogel method prepared nanocrystalline AP-MgO. The AP-MgO powder has been characterized by XRD, AFM and BET surface area measurements. Destructive adsorption of MP over AP-MgO has been compared with that of activated carbon. Both are found to adsorb methyl parathion effectively. An IR investigation of the surface of treated AP-MgO and activated carbon reveals that activated carbon adsorbs methyl parathion as such in the molecular form and AP-MgO adsorbs it destructively.</p>1 aReddy, V., S.1 aRadheShyam, A.1 aDwivedi, Reena1 aGupta, R., K.1 aChumbhale, Vilas, R.1 aPrasad, R.  uhttps://library.ncl.res.in/content/destructive-adsorption-methyl-parathion-over-nanocrystalline-mgo-002291nas a2200301   4500008004100000022001400041245012400055210006900179260008900248300001200337490000700349520127500356653001601631653001601647653000801663653000801671653001801679100001801697700001201715700002601727700002001753700001501773700001801788700001601806700001901822700001801841856013001859       2008                        eng d  a0733-521000aMolecular genetic mapping of quantitative trait loci associated with loaf volume in hexaploid wheat (Triticum aestivum)0 aMolecular genetic mapping of quantitative trait loci associated   a24-28 OVAL RD, LONDON NW1 7DX, ENGLANDbACADEMIC PRESS LTD ELSEVIER SCIENCE LTDcMAY  a587-5980 v473 a<p>Major efforts in wheat research are being made to improve the yield and quality of wheat. Loaf volume (Lv) is the main quality parameter deciding the bread making potential of wheat. To genetically dissect quantitative trait loci (QTLs) for Lv, a Recombinant Inbred Line (RIL) population (F-8) was developed from a cross between two Indian wheat varieties ``H 1977'' and ``HD 2329''. A total of 914 SSR and 100 ISSR primers were used for molecular analysis and the genetic map comprising 19 chromosomes was constructed with 202 SSR markers and 2 HMW glutenin subunit loci: Glu-B1 and Glu-B1. The phenotypic data were collected from six environments including three different agro-climatic zones for 2 consecutive years. Dissection of Lv through AMMI model revealed significant G x E variance for the trait. QTL analysis was performed using composite interval mapping. A total of 30 QTLs for Lv were detected and significant QTLs were identified on 6B and 6D chromosomes; 1B, 1D, 2A, 3A, 513 and 5D also contributed genetically to Lv. Association between 6B and 6D QTLs and variable expression of gliadins on group 6 chromosomes were discussed. QTLs detected in this study were compared with other QTL analysis in wheat. (C) 2007 Elsevier Ltd. All rights reserved.</p>10abreadmaking10aloaf volume10aQTL10aSSR10awheat quality1 aElangovan, M.1 aRai, R.1 aDholakia, Bhushan, B.1 aLagu, Meena, D.1 aTiwari, R.1 aGupta, R., K.1 aRao, V., S.1 aRoeder, M., S.1 aGupta, V., S.  uhttps://library.ncl.res.in/content/molecular-genetic-mapping-quantitative-trait-loci-associated-loaf-volume-hexaploid-wheat-002394nas a2200301   4500008004100000022001400041245011400055210006900169260009000238300001000328490000700338520136900345653001801714653001901732653001401751653000801765100002001773700002001793700001501813700001801828700001801846700002601864700001501890700001901905700002401924700001701948856012701965       2015                        eng d  a0733-521000aGenotype x environment interactions and QTL clusters underlying dough rheology traits in triticum aestivum L.0 aGenotype x environment interactions and QTL clusters underlying   a24-28 OVAL RD, LONDON NW1 7DX, ENGLANDbACADEMIC PRESS LTD- ELSEVIER SCIENCE LTDcJUL  a82-910 v643 a<p>Genetic dissection of dough rheology traits (DRT) in hexaploid wheat was carried out using nine mixograph characters evaluated in two consecutive years in three agro-climatic zones in India in an RIL population (HI977 x HD2329). Pearson correlations determined in each year-location indicated 15 stable trait inter-relationships among them but inconsistent correlations with loaf volume (LV) were observed. Using AMMI analysis we derived patterns in G x E interactions (GEI) indicating 6-47% contribution for the DRT. Composite interval mapping using a linkage map of 202 SSR markers identified 144 DRT QTLs of which, 96 were detected in single- and the rest in two to five year-locations. Sixteen QTL clusters located on ten chromosomes were identified and only three of them on chromosomes 1B, 5B and 6D involved LV QTLs. For each trait, majority of the DRT QTLs detected in single as well as multiple environments showed location-specificity and suggested that owing to GEI, breeding for wheat dough quality might need careful selection of QTLs targeted for individual agro-climatic zones. The inconsistent correlations of DRT and LV and differential locations of their QTLs in this population corroborated that using dough rheological traits alone to predict LV might pose challenges during wheat improvement. (C) 2015 Elsevier Ltd. All rights reserved.</p>10aAMMI analysis10aDough rheology10aMixograph10aQTL1 aPrashant, Ramya1 aMani, Elangovan1 aRai, Richa1 aGupta, R., K.1 aTiwari, Ratan1 aDholakia, Bhushan, B.1 aOak, Manoj1 aRoeder, Marion1 aKadoo, Narendra, Y.1 aGupta, Vidya  uhttps://library.ncl.res.in/content/genotype-x-environment-interactions-and-qtl-clusters-underlying-dough-rheology-traits-002264nas a2200277   4500008004100000022001400041245008700055210006900142260011000211300001400321490000600335520127700341100002401618700002001642700001701662700001801679700002801697700001901725700001801744700001601762700001801778700002301796700002401819700002201843856012101865       2016                        eng d  a2046-206900aField emission properties of highly ordered low-aspect ratio carbon nanocup arrays0 aField emission properties of highly ordered lowaspect ratio carb  aTHOMAS GRAHAM HOUSE, SCIENCE PARK, MILTON RD, CAMBRIDGE CB4 0WF, CAMBS, ENGLANDbROYAL SOC CHEMISTRYcJAN  a9932-99390 v63 a<p>Herein, we design and develop a field emission device utilizing highly porous carbon nanocup (CNC) films. These three-dimensional (3D) low-aspect ratio CNC structures were fabricated by a combination of anodization and chemical vapor deposition techniques. The low turn-on fields of 2.30 V mu m(-1) were observed to draw an emission current density of 1 mu A cm(-2) and a maximum emission current density of similar to 1.802 mA cm(-2) drawn at an applied field of similar to 4.20 V mu m(-1). The enhanced field emission behavior observed from the CNC films is attributed to an excellent field enhancement factor of 1645. The observed field emission properties of CNC arrays are attributed to a synergistic combination of high aspect ratio, nano-sized radius of curvature, highly organized distribution of the emitters over the whole area of specimen and lower screening effect of the CNC arrays. These observations shed light on the effect of the stacking carbon layers of CNC on their electronic properties and open up possibilities to integrate new morphologies of graphitic carbon in nanotechnology applications. Thus, the low turn on field, high emission current density and better emission current stability enable CNC based future field emission applications.</p>1 aGupta, Bipin, Kumar1 aKedawat, Garima1 aKumar, Pawan1 aSingh, Satbir1 aSuryawanshi, Sachin, R.1 aAgrawal, Neetu1 aGupta, Govind1 aKim, Ah, Ra1 aGupta, R., K.1 aMore, Mahendra, A.1 aLate, Dattatray, J.1 aHahm, Myung, Gwan  uhttps://library.ncl.res.in/content/field-emission-properties-highly-ordered-low-aspect-ratio-carbon-nanocup-arrays-0