@article { ISI:000262377000014,
	title = {Near-complete phase transfer of single-wall carbon nanotubes by covalent functionalization},
	journal = {Journal of Chemical Sciences},
	volume = {120},
	number = {6},
	year = {2008},
	note = {International Conference on Molecules and Materials - New Directions, Bangalore, INDIA, DEC 04, 2008},
	month = {NOV},
	pages = {599-606},
	publisher = {INDIAN ACAD SCIENCES},
	address = {C V RAMAN AVENUE, SADASHIVANAGAR, P B \#8005, BANGALORE 560 080, INDIA},
	abstract = {<p>We describe here an efficient phase transfer of single wall carbon nanotubes (SWNTs) from aqueous to non-aqueous media using a unique amide functionalization route, where water soluble SWNTs (2.6 mg/mL) are effectively transferred to solvents like chloroform, toluene and CS(2). A maximum of 30 wt\% of oxygenated groups have been generated on the side walls by rapid microwave treatment, leading to a solubility of more than 2.6 mg/mL in water. Approximate surface amine coverage of 50\% has been accomplished after oxalyl chloride treatment as inferred from thermogravimetry and X-ray photoelectron spectroscopy by controlling several key parameters associated with the extent of functionalization including purity of the sample, temperature and time.</p>},
	keywords = {Carbon nanotubes, microscopy, Microwave, Nanostructures, solubility of SWNTs},
	issn = {0253-4134},
	doi = {10.1007/s12039-008-0091-3},
	author = {Kakade, Bhalchandra A. and Patil, Sanjay and Sathe, Bhaskar and Gokhale, Suresh and Pillai, Vijayamohanan}
}
@article { ISI:000252678500008,
	title = {XPS and AFM investigations on silver-based photoimageable thick film systems},
	journal = {Microelectronics International},
	volume = {25},
	number = {1},
	year = {2008},
	month = {JAN},
	pages = {46-57},
	publisher = {EMERALD GROUP PUBLISHING LIMITED},
	type = {Article},
	address = {HOWARD HOUSE, WAGON LANE, BINGLEY BD16 1WA, W YORKSHIRE, ENGLAND},
	abstract = {<p>Purpose - The purpose of this paper is to ascertain chemical changes occurring at various stages involved in processing of silver-based photoimageable thick films; and to determine ensuing topographical features which other wise appeared to be hindered in 2D scanning electron microscopy. Design/methodology/approach - Surface sensitive techniques, viz. X-ray photoelectron spectroscopy (XPS) and atomic force microscopy (AFM) were used. Findings - Interfacial adhesion of silver film with substrate (Al(2)O(3)) was specifically looked into with respect to role played by photoimaging (before and after exposure to ultra-violet light). XPS results revealed occurrence of subtle chemical changes in terms of unsaturation to saturation in C-C bonding and also an interesting C-Al bonding which presumably improves mechanical adhesion of unfired film with the alumina substrate. AFM was carried out to examine the surface roughness, particle size, and microstructure of film which are very important from the standpoint of high-frequency applications. Originality/value - Surface sensitive techniques like XPS and AFM were exclusively used in order to characterize silver-based photoimageable thick films.</p>},
	keywords = {microscopy, Silver, thick film circuits, X-rays},
	issn = {1356-5362},
	doi = {10.1108/13565360810846653},
	author = {Umarji, Govind and Ketkar, Supriya and Hawaldar, Ranjit R. and Gosavi, Suresh W. and Patil, Kashinath and Mulik, Uttam P. and Amalnerkar, Dinesh P.}
}
