@article { ISI:000263353200007,
	title = {Microwave dielectric and attenuation properties of Ni0.7-xCoxZn0.3Fe2O4 thick films},
	journal = {Microelectronics International},
	volume = {26},
	number = {1},
	year = {2009},
	month = {JAN},
	pages = {43-46},
	publisher = {EMERALD GROUP PUBLISHING LIMITED},
	address = {HOWARD HOUSE, WAGON LANE, BINGLEY BD16 1WA, W YORKSHIRE, ENGLAND},
	abstract = {<p>Purpose - The aim of this paper is to investigate permittivity of nano structured Ni0.7-xCoxZn0.3Fe2O4 thick films at microwave frequencies. Design/methodology/approach - Nanosized Ni0.7-xCoxZn0.3Fe2O4 ferrites with x = 0, 0.04, 0.08 and 0.12 were prepared by sucrose precursor technique using the constituent metal nitrates. Thick films of the ferrites were fabricated on alumina substrates by screen-printing technique. Microwave dielectric constant (epsilon{\textquoteright}) and the loss factor (epsilon {\textquoteleft}{\textquoteright}) for the thick films were measured by VSWR slotted section method in the 8-18 GHz range of frequencies. Microwave attenuation properties were studied using a waveguide reflectometer set up. Findings - Both the epsilon{\textquoteright} and epsilon {\textquoteleft}{\textquoteright} were found to vary with frequency and composition x It is observed that, value of epsilon{\textquoteright} increases with increase in x, due to the increase in bulk density and reduction in porosity of the material, that resulted due to the substitution of cobalt in Ni-Zn ferrite. The microwave transmission loss offered by the thick films was found to increase with the increase in cobalt concentration x Within the band width of 4 GHz (from 12-16 GHz), all the films except that with x = 0.04 offered the reflection loss of less than 3 dB. Originality/value - The dielectric constant of Ni0.7-xCoxZn0.3Fe2O4 thick films have been reported for the first time. These thick films provide scope for cost effective planar ferrite devices.</p>},
	keywords = {Microwaves, Oxides, Thick-film circuits},
	issn = {1356-5362},
	doi = {10.1108/13565360910923160},
	author = {Rendale, M. K. and Kulkarni, S. D. and Puri, Vijaya}
}
