02326nas a2200241 4500008004100000022001400041245015600055210006900211260007300280300001000353490000800363520136000371653002201731653004101753653003901794653002801833653003101861100001801892700001901910700001601929700001301945856012601958 2006 eng d a0927-775700aMicellar behavior of dodecyldimethylethyl ammonium bromide and dodecyltrimethyl ammonium chloride in aqueous media in the presence of diclofenac sodium0 aMicellar behavior of dodecyldimethylethyl ammonium bromide and d aPO BOX 211, 1000 AE AMSTERDAM, NETHERLANDSbELSEVIER SCIENCE BVcAPR a17-250 v2783 a

The micellar properties of cationic surfactants (S) viz. dodecyldimethylethyl ammonium bromide (DDAB) and dodecyltrimethylammonium chloride (DTAC) in aqueous media in the presence of diclofenac sodium (D) have been investigated by spectroscopic and conductivity measurements. The UV-vis and H-1 NMR studies suggest possible packing of diclofenac sodiurn molecules in the micelles. The conductivity studies were carried out over the temperature range 288.15-308.15 K. The critical micelle concentration (cmc) and degree of counterion binding (beta) of the micelles were determined at different temperatures. Delay in micellisation was observed for both DDAB and DTAC. Thermodynamic parameters (Delta G(m)(0) Delta H-m(0) and Delta S-m(0).) for the micelle system were estimated by applying the charged pseudo-phase separation model. The results of the ternary S/D/W system were analysed in comparison with the reported results of binary SAV system. The Delta G(m)(0) values for the ternary S/D/W system in both the cases show an increase in comparison to the respective binary SAV system. However, Delta S-m(0) decreased with temperature and remained positive in both the systems. At lower temperatures, the micellisation was found to be entropy-driven while at higher temperatures it was enthalpy-dfiven. (c) 2005 Elsevier B.V. All rights reserved.

10adiclofenac sodium10adodecyldimethylethylammonium bromide10adodecyltrimethylammoniurn chloride10aElectrical conductivity10aspectroscopic measurements1 aMehta, S., K.1 aBhasin, K., K.1 aKumar, Anil1 aDham, S. uhttp://library.ncl.res.in/content/micellar-behavior-dodecyldimethylethyl-ammonium-bromide-and-dodecyltrimethyl-ammonium-002150nas a2200253 4500008004100000022001400041245009500055210006900150260006900219300001200288490000800300520125700308653002401565653002801589653001301617653002201630100001801652700002001670700001701690700002001707700002201727700002101749856012601770 2011 eng d a0254-058400aFabrication, thermal and electrical properties of polyphenylene sulphide/copper composites0 aFabrication thermal and electrical properties of polyphenylene s aPO BOX 564, 1001 LAUSANNE, SWITZERLANDbELSEVIER SCIENCE SAcJUL a114-1200 v1283 a

The thermal and electrical properties of high performance poly(phenylene sulphide) (PPS) composites reinforced up to 31 vol% Cu particles were investigated to be used as materials for electronic applications. The thermal stability and char yield of the composites increased significantly. Both pre- and post- glass transition coefficient of thermal expansion (CTE) of composites decreased significantly. The microhardness was increased by more than 50% compared to pure PPS matrix. Microhardness and CTE of composites correlated well with the rule of mixtures. A percolation threshold about 6 vol% Cu was obtained. The electrical conductivity was increased by about eight orders of magnitude for 18 vol% composite. Dielectric constant and dissipation factor of composites at 1 MHz was increased by about 6-fold and 70-fold compared to matrix, respectively. They decreased gradually with increasing frequency up to 1 MHz and thereafter, there was insignificant change. The scanning electron microscope showed almost uniform distribution of Cu particles in the matrix. Owing to better dimensional stability and good electrical properties, these composites are very promising for electronic applications. (C) 2011 Elsevier B.V. All rights reserved.

10aDielectric property10aElectrical conductivity10ahardness10aThermal expansion1 aGoyal, R., K.1 aKambale, K., R.1 aNene, S., S.1 aSelukar, B., S.1 aArbuj, Sudhir, S.1 aMulik, Uttam, P. uhttp://library.ncl.res.in/content/fabrication-thermal-and-electrical-properties-polyphenylene-sulphidecopper-composites-001682nas a2200241 4500008004100000022001400041245009300055210006900148260006900217300001400286490000800300520082500308653002301133653001901156653002801175653001401203100002001217700001901237700001801256700001801274700002201292856012601314 2011 eng d a0925-838800aSynthesis and characterization of chemically deposited nickel substituted CdSe thin film0 aSynthesis and characterization of chemically deposited nickel su aPO BOX 564, 1001 LAUSANNE, SWITZERLANDbELSEVIER SCIENCE SAcFEB a2948-29510 v5093 a

The technologically important Cd(0.5)Ni(0.5)Se thin film has been developed by solution growth technique on non-conducting glass substrate in tartarate bath containing Cd(+2), Ni(+2) ions and sodium selenosulphate in an aqueous alkaline medium at room temperature. Various preparative conditions of the thin films are outlined. The films were characterized by X-ray diffraction, scanning electron microscope, optical absorption and electrical measurements. The X-ray diffraction study indicates that the film is polycrystalline in nature with hexagonal phase. Scanning electron micrograph shows that the film is homogeneous with well-defined grains. The films have high optical absorption coefficient. Thermoelectric power measurement shows p-type conduction mechanism. (C) 2010 Elsevier B.V. All rights reserved.

10aChemical synthesis10aCrystal growth10aElectrical conductivity10athin film1 aHankare, P., P.1 aJadhav, B., V.1 aChate, P., A.1 aSathe, D., J.1 aMulla, Imtiaz, S. uhttp://library.ncl.res.in/content/synthesis-and-characterization-chemically-deposited-nickel-substituted-cdse-thin-film-0