@article { ISI:000236901300003, title = {Micellar behavior of dodecyldimethylethyl ammonium bromide and dodecyltrimethyl ammonium chloride in aqueous media in the presence of diclofenac sodium}, journal = {Colloids and Surfaces A-Physicochemical and Engineering Aspects}, volume = {278}, number = {1-3}, year = {2006}, month = {APR}, pages = {17-25}, publisher = {ELSEVIER SCIENCE BV}, type = {Article}, address = {PO BOX 211, 1000 AE AMSTERDAM, NETHERLANDS}, abstract = {

The micellar properties of cationic surfactants (S) viz. dodecyldimethylethyl ammonium bromide (DDAB) and dodecyltrimethylammonium chloride (DTAC) in aqueous media in the presence of diclofenac sodium (D) have been investigated by spectroscopic and conductivity measurements. The UV-vis and H-1 NMR studies suggest possible packing of diclofenac sodiurn molecules in the micelles. The conductivity studies were carried out over the temperature range 288.15-308.15 K. The critical micelle concentration (cmc) and degree of counterion binding (beta) of the micelles were determined at different temperatures. Delay in micellisation was observed for both DDAB and DTAC. Thermodynamic parameters (Delta G(m)(0) Delta H-m(0) and Delta S-m(0).) for the micelle system were estimated by applying the charged pseudo-phase separation model. The results of the ternary S/D/W system were analysed in comparison with the reported results of binary SAV system. The Delta G(m)(0) values for the ternary S/D/W system in both the cases show an increase in comparison to the respective binary SAV system. However, Delta S-m(0) decreased with temperature and remained positive in both the systems. At lower temperatures, the micellisation was found to be entropy-driven while at higher temperatures it was enthalpy-dfiven. (c) 2005 Elsevier B.V. All rights reserved.

}, keywords = {diclofenac sodium, dodecyldimethylethylammonium bromide, dodecyltrimethylammoniurn chloride, Electrical conductivity, spectroscopic measurements}, issn = {0927-7757}, doi = {10.1016/j.colsurfa.2005.11.071}, author = {Mehta, S. K. and Bhasin, K. K. and Kumar, Anil and Dham, S.} } @article { ISI:000291525400022, title = {Fabrication, thermal and electrical properties of polyphenylene sulphide/copper composites}, journal = {Materials Chemistry and Physics}, volume = {128}, number = {1-2}, year = {2011}, month = {JUL}, pages = {114-120}, publisher = {ELSEVIER SCIENCE SA}, address = {PO BOX 564, 1001 LAUSANNE, SWITZERLAND}, abstract = {

The thermal and electrical properties of high performance poly(phenylene sulphide) (PPS) composites reinforced up to 31 vol\% Cu particles were investigated to be used as materials for electronic applications. The thermal stability and char yield of the composites increased significantly. Both pre- and post- glass transition coefficient of thermal expansion (CTE) of composites decreased significantly. The microhardness was increased by more than 50\% compared to pure PPS matrix. Microhardness and CTE of composites correlated well with the rule of mixtures. A percolation threshold about 6 vol\% Cu was obtained. The electrical conductivity was increased by about eight orders of magnitude for 18 vol\% composite. Dielectric constant and dissipation factor of composites at 1 MHz was increased by about 6-fold and 70-fold compared to matrix, respectively. They decreased gradually with increasing frequency up to 1 MHz and thereafter, there was insignificant change. The scanning electron microscope showed almost uniform distribution of Cu particles in the matrix. Owing to better dimensional stability and good electrical properties, these composites are very promising for electronic applications. (C) 2011 Elsevier B.V. All rights reserved.

}, keywords = {Dielectric property, Electrical conductivity, hardness, Thermal expansion}, issn = {0254-0584}, doi = {10.1016/j.matchemphys.2011.02.065}, author = {Goyal, R. K. and Kambale, K. R. and Nene, S. S. and Selukar, B. S. and Arbuj, Sudhir S. and Mulik, Uttam P.} } @article { ISI:000287058100062, title = {Synthesis and characterization of chemically deposited nickel substituted CdSe thin film}, journal = {Journal of Alloys and Compounds}, volume = {509}, number = {6}, year = {2011}, month = {FEB}, pages = {2948-2951}, publisher = {ELSEVIER SCIENCE SA}, address = {PO BOX 564, 1001 LAUSANNE, SWITZERLAND}, abstract = {

The technologically important Cd(0.5)Ni(0.5)Se thin film has been developed by solution growth technique on non-conducting glass substrate in tartarate bath containing Cd(+2), Ni(+2) ions and sodium selenosulphate in an aqueous alkaline medium at room temperature. Various preparative conditions of the thin films are outlined. The films were characterized by X-ray diffraction, scanning electron microscope, optical absorption and electrical measurements. The X-ray diffraction study indicates that the film is polycrystalline in nature with hexagonal phase. Scanning electron micrograph shows that the film is homogeneous with well-defined grains. The films have high optical absorption coefficient. Thermoelectric power measurement shows p-type conduction mechanism. (C) 2010 Elsevier B.V. All rights reserved.

}, keywords = {Chemical synthesis, Crystal growth, Electrical conductivity, thin film}, issn = {0925-8388}, doi = {10.1016/j.jallcom.2010.11.165}, author = {Hankare, P. P. and Jadhav, B. V. and Chate, P. A. and Sathe, D. J. and Mulla, Imtiaz S.} }